M. RAMANA KUMAR, S. SREENATH KASHYAP. Automated Industrial Defect Detection and Accurate Fractional-Grade Classification . Journal of Computational Analysis and Applications (JoCAAA), [S. l.], v. 33, n. 08, p. 9008–9019, 2024. Disponível em: https://eudoxuspress.com/index.php/pub/article/view/5613. Acesso em: 8 sep. 2026.